MNT235 — Nano Chrctrztn Tools & Tchnqs
Overview of characterization tools and techniques for nanotechnology structures and materials. Includes procedures for light, physical, and electron beam characterization. Also includes tools and processes for advanced Scanning Probe Microscopy (SPM) and surface analysis. Aligns with ASTM Nano-Characterization standards and its exam. Additional applications enable students to prepare for certification examinations.