EES5321 — Scan Electron Microscopy Meth
Presents the basic physics of scanning electron microscopy, including electron beam generation, image formation, signal detection, and beam-sample interactions. Basic sample preparation methods for scanning electron microscopy will be presented and demonstrated in laboratory sessions. How characteristic x-rays are produced in a sample and how they are measured and quantified will also be presented. Use of the SEM to collect data and instruction on how to organize collected data in a logical manner. Credit will not be granted if already received for GEOL 5321. prereq: CHEM 1155 or 1175, and minimum 75 credits; or grad student; or instructor consent.